| M1 | Films and Multilayers | |
| M1.1 | HTS Thin Films: Synthesis, Structure | |
| M1.2 | HTS Multilayers and Materials Integration Issues | |
| M1.3 | Substrate and Buffer-Layer Issues | |
| M1.4 | LTS Thin Films and Multilayers | |
| M1.5 | MgB2 Thin Films and Multilayers | |
| M1.6 | Large Area Films | |
| M1.7 | Films and Coatings for SRF Cavities | |
| M1.8 | Pnictide Films | |
| M1.9 | Thin Film Structural Characterization | |
| M2 | Other Materials Applications | |
| M2.1 | SRF Cavities: Forming and Welding | |
| M2.2 | SRF Cavities: Processing and Performance | |
| M2.3 | Melt Textured Conductors | |
| M2.4 | HTS Bulk for Bearings and Permanent Magnets | |
| M3 | Synthesis, Doping, and Property Optimization | |
| M3.1 | General Materials Science of Applied Superconductors | |
| M3.2 | HTS Bulk and Crystals | |
| M3.3 | MgB2 Bulk and Crystals | |
| M3.4 | LTS Bulk and Crystals | |
| M3.5 | SRF: Niobium Materials Science | |
| M3.6 | Pnictides: Crystals and Other Basic Forms | |
| M3.7 | Pnictides: Synthesis of Applied Forms | |
| M3.8 | Pnictides: Properties of Interest to Applications | |
| M4 | Property Characterizations | |
| M4.1 | AC Losses: HTS | |
| M4.2 | AC Losses: LTS and MgB2 | |
| M4.3 | AC Losses: General, Modeling, and Other Materials | |
| M4.4 | Microwave Losses | |
| M4.5 | HTS: Stability, Calorimetry, and Other Thermal Properties | |
| M4.6 | LTS: Stability, Calorimetry, and Other Thermal Properties | |
| M4.7 | Transport Measurement Techniques | |
| M4.8 | Magnetic Measurement Techniques | |
| M4.9 | Critical Current, Flux Pinning and Flux Dynamics: HTS | |
| M4.10 | Critical Current, Flux Pinning and Flux Dynamics: LTS and MgB2 | |
| M4.11 | Flux Pinning and Flux Dynamics: General, Modeling, and Other Materials | |
| M4.12 | Mechanical Properties: HTS | |
| M4.13 | Mechanical Properties: LTS and MgB2 | |
| M4.14 | Mechanical Properties: General, Modeling, and Other Materials | |
| M4.15 | Microwave Properties and Characterization | |
| M4.16 | SRF: Temperature Mapping, Optical Inspection, and Other QA | |
| M4.17 | Other Measurement Techniques |